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WINTER-SPRING 2003

Acknowledgement

 

IJECE Editorial-Board would like to appreciate the following distinguished referees for spending their invaluable time and expertise in reviewing the manuscripts and their constructive suggestions which had a great impact on the enhancement of this issue of the IJECE Journal.

A

Venkataramana Ajjarap, Iowa State University, Ames, US

Houman Alborzi, University of Maryland, College Park, US

Martin Arnold, DLR German Aerospace Center, Wessling, Germany

Martti Aro, Helsinki University of Technology, Espoo, Finland

 

 B

Christopher Baker, University of Manchester, Manchester, UK

Ezio Biglieri, Politecnico di Torino, Torino, Italy

Hans Blok, Delft University of Technology, Delft, The Netherlands

Bimal K. Bose, University of Tennessee, Knoxville, US

N. K. Bose, Pennsylvania State University, University Park, US

Ahmed Bouridane, Queen's University, Belfast, UK

P. J. Costa Branco, Instituto Superior Tecnico, Lisbon, Portugal

 

 C

Jim Cathey, University of Kentucky, Lexington, US

Chi-Hou Chan, City University, Hong Kong, China

Bor-Sen Chen, National Tsing Hua University, Hsinchu, Taiwan

Laurie A. Christian, Measurement Standards Laboratory of New Zealand, Lower Hutt, New Zealand

Alfio Consoli, University of Catania, Catania, Italy

David G. M. Cruickshank, University of Edinburgh, Edinburgh, UK

 

 D

Kourosh Danai, University of Massachusetts, Amherst, US

Andy Doonan, DuPont Teijin Films Ltd., Middlesbrough, UK

 

 E

Abdel-Aty Edris, Electric Power Research Institute, Palo Alto, US

Hamid Elahi, General Electric Co., US

Ali Emadi, Illinois Institute of Technology, Chicago, US

 

F

M. Fathi, Iran University of Science and Technology, Tehran, Iran

Klaus Froehlich, Swiss Federal Institute of Technology, Zurich, Switzerland

Li-Chen Fu, National Taiwan University, Taipei, Taiwan  

 

G

Francisco D. Galiana, McGill University, Montreal, Canada

Flavio Galliana, Istituto Elettrotecnico Naz. (IEN) - G. Ferraris, Torino, Italy

 

H

Yeong-Ho Ha, Kyungpook National University, Taegu, South Korea

Gerald T. Heydt, Arizona State University, Tempe, US

D. Grahame Holmes, Monash University, Victoria, Australia

Liu Hsu, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil

Jinglu Hu, Kyushu University, Fukuoka-shi, Japan

 

I

Malcolm Irving, Brunel University, Middlesex, UK

 

J

Rafael Kalman Jardan, Budapest University of Technology and Economics, Budapest, Hungary

N. Jenkins, UMIST, Manchester, UK

 

K

Lance M. Kaplan, Clark Atlanta University, Atlanta, US

T. W. Kim, University of Hawaii, Honolulu, US

Takio Kurita, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan

 

L

Robert G. Landers, University of Missouri, Rolla, US

Thomas A. Lipo, University of Wisconsin, Madison, US

Guangjun Liu, Ryerson University, Toronto, Canada

Fernando Lizarrald, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil

Ahmad Lotfi, Nottingham Trent University, Nottingham, UK

Patrick Luk, Cranfield University, Bedfordshire, UK

 

M

Stephen Marshall, University of Strathclyde, Glasgow, UK

Farokh Marvasti, King's College London, London, UK

N. Harris McClamroch, University of Michigan, Ann Arbor, US

Mauro Mongiardo, Università di Perugia, Perugia, Italy

M. K. Moravvej Farshi, Tarbiat Modarres University, Tehran, Iran

Kristi A. Morgansen, California Institute of Technology, Pasadena, US

David Murray-Smith, University of Glasgow, Glasgow, UK

 

N

K. Naito, Meijo University, Nagoya, Japan

Sergey Nikitin, Arizona State University, Tempe, US

Akinori Nishihara, Tokyo Institute of Technology, Tokyo, Japan

Hassan Nouri, University of West England, Bristol, UK

 

O

 

P

Francesco Profumo, Politecnico di Torino, Torino, Italy

Q


 

R

Ursula van Rienen, Rostock University, Rostock, Germany

Ewen Ritchie, Aalborg University, Aalborg, Denmark

 

S

Nader Sadegh, Georgia Institute of Technology, Atlanta, US

H. R. Sadegh Mohammadi, Electrical Engineering Research Institute of Jahad Daneshgahi, Tehran, Iran

Hanan Samet, University of Maryland, College Park, US

Dan Schonfeld, University of Illinois, Chicago, US

Hossein Seifi, Tarbiat Modarres University, Tehran, Iran

Daohang Sha, Northwestern University Medical School, Chicago, US

Mohsen Shahinpoor, University of New Mexico, Albuquerque, US

Gerald B. Sheblé, Iowa State University, Ames, US

Rahul Shukla, Swiss Federal Institute of Technology, Zurich, Switzerland

Peter L. Stanchev, Kettering University, Flint, US

 

T

Mahmoud Tarokh, California State University, San Diego, US

Hamid A. Toliyat, Texas A&M University, College Station, US

Masayoshi Tomizuka, University of California, Berkeley, US

 

U

 

V

S. Vaez-Zadeh, Tehran University, Tehran, Iran

Martin Vetterli, Swiss Federal Institute of Technology, Zurich, Switzerland

Luigi Villani, Università degli Studi di Napoli Federico II, Napoli, Italy

 

W



X

 

Y

Olli Yli-Harja, Tampere University of Technology, Tampere, Finland

Ryuuichi Yokoyama, Tokyo Metropolitan University, Tokyo, Japan

 

Z

ISSN: 1682-0053
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