%0 Journal Article
%A Kamran, A., Moradi Gheisvandi, Z.
%T Automatic Test Pattern Generation for Digital Combinational Circuits Using an Approximate Parallel Pattern Critical Path Tracing Index
%J Nashriyyah -i Muhandisi -i Barq va Muhandisi -i Kampyutar -i Iran
%V 23
%N 3
%P 198-208
%D 2026
%R 
%U https://rimag.ir/fa/Article/51260